Category Archives: Lecture

Technical Lecture (May 29, 2021)

The technical lecture which was organized by IEEE Hiroshima Section was held on May 29, 2021.

Title: Let’s make the IEEE Hiroshima Section Student Symposium(HISS) successful!
Speaker: Prof. Masashi Hotta
Location: Online (Zoom)
Date: May 29, 2021
Time: 15:00-15:20
Attendance: 50 (IEEE Member:23)

Technical Lecture (April 2, 2021)

The technical lecture which was organized by IEEE Hiroshima Section was held on April 2, 2021.

Title: Development of detection method for defect in the casting and evaluation method of material properties for steel using magnetic non-destructive testing

Speaker: Prof. Kenji Sakai

Abstract: Non-destructive testing (NDT) is an essential technology for ensuring the safety of structures and products. Until now, many NDT methods have been developed and used in the practical field. However, the NDT method should evaluate new materials and products because many high-performance materials and products are developed recently. In this presentation, the magnetic NDT method which is non-contact and composed of simple system is introduced and its application to the evaluation of defect generated in the casting and material properties for steel which are difficult to evaluate using the conventional NDT method is presented.

Location: Online (Webex)
Date: April 2, 2021
Time: 15:00-16:10
Attendance: 13 (IEEE Member:13)

22nd IEEE Hiroshima Section Student Symposium

The 22nd IEEE Hiroshima Section Student Symposium (22nd HISS) will be held in November 28 and 29, 2020.

Symposium Website (Japanese only)

Keynote Lecture

Title: Memory Technology Trends and Micron: The Future Starts Here

Speaker: Linda Somerville

Abstract: Every day, 2.5 quintillion bytes of data are created, and Micron’s memory devices are where data lives, where data goes to work, and where data becomes intelligence. The advent of 5G, smart cities, smart grids, smart manufacturing and autonomous vehicle ecosystems will transform the memory industry and our daily life. Micron is a critical part of the world’s data economy, meeting our customers’ needs today and tomorrow with the industry’s broadest, most innovative portfolio of memory, storage and accelerator solutions.

Technical Lecture(September 12, 2020)

The technical lecture which is organized by IEEE Hiroshima Section was held on September 12, 2020.

Title: Consideration on the relationship between aesthetic quality estimation of photographs using deep learning and composition
Speaker: Prof. Hironori Takimoto (Okayama Prefectural University)
Location: Online
Date: Sept. 12, 2020
Attendance: 14

Technical Lecture(June 27, 2020)

The technical lecture which is organized by IEEE Hiroshima Section was held on June 27, 2020.

Date: June 27, 2020 14:30-15:00
Location: Zoom meeting
Sponsored: IEEE Hiroshima Section
Speaker: Prof. Masashi Hotta (Yamaguchi University)
Title: What can you get from the experience in the IEEE Hiroshima Section Student Symposium?
Registration fee: Free

Technical Lecture (April 18, 2020)

The technical lecture which is organized by IEEE Hiroshima Section was held on April 18, 2020.


Date: April 18, 2020 14:30-15:30
Location: Zoom meeting
Sponsored: IEEE Hiroshima Section
Speaker: Prof. TOMISATO Shigeru (Okayama University)
Title: LED Visible Light Communication in Wireless Communication
Registration fee: Free

Technical Lecture (November 30, 2019)

The technical lecture which is organized by IEEE Hiroshima Section was held on November 30, 2019.


Date: November 30, 2019 14:00-15:00
Location: Okayama Prefectural University, Soja, Okayama, Japan
Sponsored: IEEE Hiroshima Section
Speaker: Mr. Soichi Kataoka (Mayor of Soja City, Okayama Prefecture)
Title: City disaster ability test of city hall -optimistic thought do not pass-
Registration fee: Free