IEEE Kansai Section第27回技術講演会

IEEE Kansai Section第27回技術講演会
The 27th IEEE Kansai Section Lecture Meeting

その第27回目として、米国ミシガン州立大学のrof. Anli K. Jainをお招きし、以下の要領で 講演会を開催致します。


IEEE Kansai Section will have the 27th IEEE Kansai Section Lecture Meeting as follows. Anyone can attend it even if you are not a member.



Biometrics: A Grand Challenge


米国ミシガン州立大学 Prof. Anil K. Jain

日時(Time & Date)

Monday, November 29, 2004 13:30~15:00


(株)国際電気通信基礎技術研究所 地下大会議室  (ATR Conference Room)
          〒619-0288 京都府相楽郡精華町光台2-2-2
           近鉄京都線 新祝園駅より奈良交通バス10分、近鉄京都線高の原駅よりタクシー10分


IEEE 関西支部




Reliable person recognition is an important problem in diverse business and government applications. Biometrics, recognition based on distinctive personal traits, has the potential to become an irreplaceable part of many human identification systems. While successful in some niche markets, the biometrics technology has not yet delivered its promise of foolproof automatic human recognition. With the availability of inexpensive biometric sensors and computing power, it is becoming increasingly clear that broader usage of biometric technologies is being stymied by our lack of understanding of four fundamental problems:
     (i) How to accurately and efficiently represent and recognize biometric patterns?
     (ii) How to guarantee that the sensed measurements are not fraudulent?
     (iii) How to acquire repeatable and distinctive patterns from a large population?
     (iv) How to make sure that the application is indeed exclusively using pattern recognition for the expressed purpose (function creep)? Solving these core problems will be required to move biometrics into mainstream applications and may also stimulate adoption of other pattern recognition applications for providing effective automation of sensitive tasks without jeopardizing individual freedoms. For these reasons, we view biometrics as a grand challenge - "a fundamental problem in science and engineering with broad economic and scientific impact".
Considering the recent mandates of several governments for the nationwide use of biometrics in delivering crucial societal functions, it is evident that biometrics would profoundly impact the way identity is established in the 21st century. This talk will introduce biometric systems, state-of-the-art performance, and fusion of several modalities (multibiometrics) to improve recognition performance, avoid spoofing and reduce failure to enroll rate.


Anil Jain is a University Distinguished Professor in the Departments of Computer Science & Engineering and Electrical & Computer Engineering at Michigan State University. He received his B.Tech. degree from I.I.T., Kanpur and M.S. and Ph.D. degrees from Ohio State University, all in Electrical Engineering. His research interests include statistical pattern recognition, data clustering, texture analysis, document image understanding and biometric authentication. He received awards for best papers in 1987 and 1991, and for outstanding contributions in 1976, 1979, 1992, 1997 and 1998 from the Pattern Recognition Society. He also received the 1996 IEEE Transactions on Neural Networks Outstanding Paper Award. He was the Editor-in-Chief of the IEEE Transactions on Pattern Analysis and Machine Intelligence between 1991-1994. He is a fellow of the IEEE, ACM, and International Association of Pattern Recognition (IAPR). He has received a Fulbright Research Award, a Guggenheim fellowship and the Alexander von Humboldt Research Award. He delivered the 2002 Pierre Devijver lecture sponsored by the International Association of Pattern Recognition (IAPR). He holds six patents in the area of fingerprint matching. He is the author of a number of books, including Biometric Systems, Technology, Design and Performance Evaluation, Springer 2004, Handbook of Face Recognition, Springer 2004, Handbook of Fingerprint Recognition, Springer 2003 (received the 2003 PSP award from the Association of American Publishers), BIOMETRICS: Personal Identification in Networked Society, Kluwer 1999, 3D Object Recognition Systems, Elsevier 1993, Markov Random Fields: Theory and Applications, Academic Press 1993, Neural Networks and Statistical Pattern Recognition, North-Holland 1991, Analysis and Interpretation of Range Images, Springer-Verlag 1990, Algorithms For Clustering Data, Prentice-Hall 1988, and Real-Time Object Measurement and Classification, Springer-Verlag 1988. He is a member of the study team on Whither Biometrics being conducted by the National Academy of Sciences (CSTB).

参加費 (Fee)

無料 Free
   Anyone can attend it even if you are not a member.

参加申込み先 (Contact for registration)

   ATR音声言語コミュニケーション研究所 柴田 葉子
   Yoko Shibata (ATR)
      Tel: (0774) 95 1347 / Fax: (0774) 95 1308
  会場準備の都合上、参加ご希望の方は、所属、お名前(ふりがな)および IEEE会員番号を上記参加申し込み先までEmail (Faxでも結構です)にて 11月22日(月)までにお知らせください。
Please register in advance. E-mail or fax IEEE member ID, your name and affiliation by November 22 (mon).

本件連絡先 (For further information)

     IEEE Kansai Section Technical Program Committee Secretary


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