Japanese Version
2007 Special Lecture on EMC
December 10, 2007, NHK-Seizan Sou, Tokyo

Youji KOTSUKA, Chair
IEEE EMC Society Japan Chapter

IEEE EMC Society Japan Chapter will have the Special Lecture Meeting as follows. Anyone can attend it even if you are not a member.
"On Progress Towards a Virtual EMC Laboratory" Summary

The high-frequency design of modern systems for electromagnetic compatibility (EMC) and signal integrity (SI) is characterised by extreme complexity, very substantial costs, rapid time to market and the requirement that the design is "right first time". Many markets, such as PCs and mobile phones, dictate very rapid design turn-round cycles which precludes extensive redesign and experimental optimization. The consequence of these trends is that traditional iterative experimental design techniques, which require the availability of an early prototype, are being replaced by computer-aided design (CAD) methods. Questions then arise as to how valid, accurate, and representative of real things these methods are. Some believe that measurement in a laboratory is the ultimate representation of reality and that a simulation is somewhat lesser artificial and an ersatz approach. A more realistic attitude is to accept that there are good and bad measurements as there are good and bad simulations. No one can legitimately claim that one approach excels under all circumstances. Skilful designers use a combination of measurements and simulations to gain the best possible understanding of the inherent complex interactions in real systems. In the electrical field, and in the area of EMC in particular, the difficulties of doing accurate representative measurements are considerable and the need to supplement them by carefully considered numerical models and simulations is obvious. An early assessment of EMC issues at the design stage is essential as it helps de-risk designs against failure of compliance to EMC regulations. The aim of the presentation is not to show that simulations are "better" or "more accurate" but rather to explain how and under what circumstances they can complement with benefit other approaches such as measurements. The ultimate aim is to produce a "virtual laboratory" for EMC studies to complement and in some cases partially replace extensive experimental procedures. A virtual laboratory frees the investigator from the constrains of a physical laboratory (e.g. high costs, unavailability of particular materials etc) and underpins "thought experiments" which may result to novel artificial materials and designs which may have huge impact on EMC. The presentation will cover a number of issues of importance in engineering design including,

"Frequency Modulated Probe for Electromagnetic Measurement" Summary

This talk introduces approaches to measure electromagnetic near-field and far-field by using frequency modulated probe. A non-invasive near-field measurement method using a modulated scattering element(MSE) as the probe is described. A directive MSE probe is developed to improve the accuracy of measurement. A near-field measurement system using the MSE is developed which is applied to the measurement of near-field distribution on microstrip line to demonstrate accuracy of the measurement. Further, a simultaneous measurement method using parallel frequency modulated probe array is introduced to measure the far field radiated by antennas at different locations simultaneously. The effect of the local signal on the received IF signal and interaction effect between the probe array and the measured antenna are investigated. A 3-D antenna radiation measurement system based on the present method is developed. The performance of the system is demonstrated by measuring the radiation efficiency of antennas.

Time, Date: Monday, December 10, 2007, 14:00`17:00
Place for the lecture: NHK-Seizan Sou
5-2-20 Minamiaoyama, Minato-ku, Tokyo 107-0062, Japan
Tel. +81-3-3400-3111

For more information, please contact to
Dr. Kimitoshi Murano(Tokai University)
Fax: +81-463-58-8320

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IEEE EMC Society Japan Chapter